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SR-NIEL – 7

Screened Relativistic (SR) Treatment for NIEL Dose

Nuclear and Electronic Stopping Power Calculator

(version 10.14)

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Occurance probability of large energy depositions due to recoil of target nuclei, e.g., single event effects (SEE), generated by spectral fluences of particles impinging perpendicularly on the device front face

Incident Particle
Incident Particle:
Device Materials and Parameters
Emax : [MeV]
Device Thickness : [g cm-2]
Target Materials
Device Material Selection:
N° Elements:
Target Material Z Stoichiometric Index or Element Fraction
SEE Cross Section
Saturation cross section - A: [cm2/device]
LET Threshold - x0: [MeV cm2 mg-1]
Width parameter - PW:
Exponent - s:
Spectral Fluence
values:
use dot "." as decimal separator;
at least, a pair (energy and spectral fluence) of values are required
Energy
[MeV]		Spectral Fluence
[cm-2 MeV-1]


EXAMPLE:
Copy and paste the data here to reproduce the following example.
Spectral fluence data are calculated with JOREM Model implemented in SPENVIS assuming a 4π sr solid angle exposure.

NOTE:
  • The default value Emax=25 MeV corresponds to the effective maximum ionizing energy deposited and absorbed from the recoil silicon nucleus (with a total range of about 9.5-10.0 μm in silicon medium) inside the device medium due to its finite size.
  • The sr-treatment has accuracy of about some percent at 50-200 keV/nucleon (see Sect 2.2.2 in [Leroy and Rancoita (2016)]).
  • The calculator provides both the total number of SEE due to recoil and the spectral recoil probability.
  • Example of target selection for single elements and compounds
    Selection for Protons in Silicon:

    Selection for Protons in GaAs:

    Selection for Protons in Water Liquid:

    • Details
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